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Determination of the RF-noise source parameters in AlInAs/GaInAs-HEMT heterostructures based on measured noise temperature dependence against electric field

✍ Scribed by Bergamaschi, C.; Patrick, W.; Baechtold, W.


Book ID
114447499
Publisher
The Institution of Electrical Engineers
Year
1995
Tongue
English
Weight
458 KB
Volume
142
Category
Article
ISSN
1350-2409

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