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Determination of the propagation length of surface plasmons with the scanning tunneling microscope

✍ Scribed by J.-P. Thost; W. Krieger; N. Kroo; Z. Szentirmay; H. Walther


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
512 KB
Volume
103
Category
Article
ISSN
0030-4018

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Photovoltaic characterization of WSe2 wi
✍ S. Akari; M. Ch. Lux-Steiner; K. GlΓΆckler; T. Schill; R. Heitkamp; B. Koslowski; πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 509 KB

In the present study we use the Scanning Wneling Microscope (STM) as an instrument to investigate the photovoltaic properties of semiconducting materials. The surfaces of the layered semiconductor WSe, were optically illuminated during the tunneling process. The resulting photo-induced tunneling cur