๐”– Bobbio Scriptorium
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Determination of the orientation symmetry axis of graphite specimens

โœ Scribed by David R. Schryer

Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
396 KB
Volume
18
Category
Article
ISSN
0008-6223

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โœฆ Synopsis

A technique is described for determining the true orientation symmetry axis of graphite specimens from conventional X-ray diffraction data. The technique, although developed for graphite, is applicable to any material exhibiting crystalline orientation which is symmetric about some axis. The requisite equations are derived for applying the procedure to both Bacon transmission data and rotating specimen reflection data. Results are presented which show that the symmetry axis of eleven molded graphites tested differed significantly from their nominal pressing directions.

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