Determination of the metal nanometer layer thickness and semiconductor conductivity in metal-semiconductor structures from electromagnetic reflection and transmission spectra

✍ Scribed by D. A. Usanov; A. V. Skripal; A. V. Abramov; A. S. Bogolyubov

• Book ID: 111447662
• Publisher: Springer
• Year: 2006
• Tongue: English
• Weight: 245 KB
• Volume: 51
• Category: Article
• ISSN: 1063-7842
• DOI: 10.1134/s1063784206050173