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Determination of the metal nanometer layer thickness and semiconductor conductivity in metal-semiconductor structures from electromagnetic reflection and transmission spectra

โœ Scribed by D. A. Usanov; A. V. Skripal; A. V. Abramov; A. S. Bogolyubov


Book ID
111447662
Publisher
Springer
Year
2006
Tongue
English
Weight
245 KB
Volume
51
Category
Article
ISSN
1063-7842

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