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Determination of the internal magnetic field from the A-T critical line in magnetic semiconductor thin films

✍ Scribed by M. Lubecka; L.J. Maksymowicz; R. Szymczak; W. PowroŹnika

Book ID
114227676
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
146 KB
Volume
177-181
Category
Article
ISSN
0304-8853

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