Determination of the hole effective mass in thin silicon dioxide film by means of an analysis of characteristics of a MOS tunnel emitter transistor

✍ Scribed by Vexler, M I; Tyaginov, S E; Shulekin, A F

• Book ID: 121208983
• Publisher: Institute of Physics
• Year: 2005
• Tongue: English
• Weight: 690 KB
• Volume: 17
• Category: Article
• ISSN: 0953-8984
• DOI: 10.1088/0953-8984/17/50/023