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Determination of the field source distribution based on field measurements

โœ Scribed by R. Palka

Publisher
Springer
Year
1985
Tongue
English
Weight
427 KB
Volume
68
Category
Article
ISSN
1432-0487

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The current J and magnetic field H distributions in a thin film have been calculated for arbitrary changes of the external field (He). A joint solution of equations describing the field and current distributions in three different states (Meiuner, critical and mixed) taking into account a tangential