𝔖 Bobbio Scriptorium
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Determination of the fast axis with an infrared spectrometer for quartz and mica waveplates

✍ Scribed by Li, Guohua ;Li, Jizhong ;Li, Yi


Book ID
115340824
Publisher
The Optical Society
Year
1990
Tongue
English
Weight
545 KB
Volume
29
Category
Article
ISSN
1559-128X

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The use of a quartz crystal microbalance
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Mass values obtained with a quartz crystal microbalance (QCM) were used together with ellipsometric and cyclic voltammetric data to examine some basic properties of thin Nafion films containing elcctroactive counterions. The viscoelastic properties of the coatings, their ion-exchange capacities and