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Determination of the energy barrier for structural relaxation in amorphous Si and Ge by Raman scattering

✍ Scribed by R. Tsu; J. Gonzalez-Hernandez; Fred H. Pollak

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 310 KB
Volume: 54
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(85)90947-0

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