✦ LIBER ✦
Determination of the depth distribution of carriers in silicon molecular beam epitaxially grown material by electrochemical capacitance-voltage measurements
✍ Scribed by Song Kechang; J.-M. Baribeau; D.C. Houghton; J.A. Jackman
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 415 KB
- Volume
- 184
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.