Determination of the contribution of defect creation and charge trapping to the degradation of a-Si:H/SiN TFTs at room temperature and low voltages

✍ Scribed by A.R. Merticaru; A.J. Mouthaan; F.G. Kuper

• Book ID: 116669693
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 132 KB
• Volume: 352
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2006.06.011