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Determination of the concentration of surface hydroxyl groups on silicon dioxide particles by the method of IR spectroscopy

โœ Scribed by B. Z. Gorbunov; A. S. Safatov

Publisher
Springer US
Year
1982
Tongue
English
Weight
516 KB
Volume
36
Category
Article
ISSN
0021-9037

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Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method
โœ McCafferty, E.; Wightman, J. P. ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 390 KB ๐Ÿ‘ 1 views

Quantitative XPS has been used to determine the surface concentration of hydroxyl groups in native air-formed oxide รlms on metals having low surface areas. A mathematical expression has been derived to give the concentration of surface hydroxyl groups as a function of the intensity ratio of the OH