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DETERMINATION OF THE COMPLEX REFRACTIVE INDEX OF POROUS SILICON LAYERS ON CRYSTALLINE SILICON SUBSTRATES

✍ Scribed by ARENAS, M. C.; HU, HAILIN; NAVA, R.; DEL RÍO, J. A.

Book ID: 120610829
Publisher: World Scientific Publishing Company
Year: 2010
Tongue: English
Weight: 604 KB
Volume: 24
Category: Article
ISSN: 0217-9792
DOI: 10.1142/S0217979210054932

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