Determination of the carrier lifetime from the open-circuit voltage decay of p-i-n rectifiers at high-injection levels

✍ Scribed by Ben Hamouda, M.J.; Gerlach, W.

• Book ID: 114594117
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 300 KB
• Volume: 29
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1982.20812