Determination of sub-ng g−1 concentrations of thorium and uranium in microelectronic materials by radiochemical neutron activation analysis
✍ Scribed by M. Franek; V. Krivan
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 774 KB
- Volume
- 274
- Category
- Article
- ISSN
- 0003-2670
No coin nor oath required. For personal study only.
✦ Synopsis
A radmchenucal neutron actlvatlon analysis technique for the determmatlon of thonum and uranmm m various high-purity nucroelectromc materials was developed It 1s based on the production of 233Pa and 23gNp as indicator radlonuchdes for Th and U, respectively, and their simultaneous separation by amon exchange from 12 M hydrochlonc acid followed by elutlon with 1 M ammonmm fluonde Usmg the radiotracer technrque, separation yields of Np and Pa and 32 other elements were determmed The method was applied to the determmatlon of Th and U at ng g-l and sub-ng g-* levels m high-punty quartz, silicon mtnde, polylmlde and alummmm oxide Depending on the kmd and punty grade of the sample, hmlts of detection of lo-100 pg g-' were achieved Comparison of the results obtained by this method with those obtained by Instrumental neutron activation analysls and mductwely coupled plasma mass spectrometry showed satisfactory agreement and illustrates the advantages of this technique when ultra-low concentrations of Th and LJ are to be determined