Determination of structure factors of X-rays using half-widths of the Bragg diffraction curves from perfect single crystals

✍ Scribed by S. Kikuta

• Publisher: John Wiley and Sons
• Year: 1971
• Tongue: English
• Weight: 579 KB
• Volume: 45
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.2220450138

✦ Synopsis

Abstract

For determining precisely the absolute values of X‐ray atomic scattering factors (f‐values) the half‐widths of the Bragg diffraction curves of perfect single crystals are utilized. The principle of the method and the experimental procedure are described. Using a double‐crystal diffractometer of parallel setting with CuKα~1~ radiation, the f‐value for the 422 reflection of silicon was determined with an accuracy better than 0.3% in a favourable case, which is in good agreement with the theoretical one. Even strongly absorbing crystals can be used as specimens, a size of the perfect region of about 0.5 mm will be sufficient for the measurements. The present method seems to be promising.