Determination of structure factors of germanium by the critical-voltage and convergent-beam diffraction methods
β Scribed by Shishido, T. ;Tanaka, M.
- Publisher
- John Wiley and Sons
- Year
- 1976
- Tongue
- English
- Weight
- 556 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0031-8965
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The heights of ledges on 0' plates in Al-4 wt"/, Cu annealed for 90 min at 275Β°C after a solution treatment for 24 h at 540Β°C have been determined by convergent beam electron diffraction and lattice plane imaging. Ledges with smaller heights (between 0.29 and 2 nm) than those found by Weatherly and
## Synchrotron powder data on as-synthesized AlPOd-was indexed on a cubic cell with a = 13.3832(6) A and systematic absences of hkl with h + k, h + I, k + I = odd and hhl with h + I = odd. The most probable space group is f23 (#196), assuming alternation of the aluminum and phosphorus atoms. The f