Determination of slow surface states in semiconductors by a surface acoustic wave technique
โ Scribed by BAUDRAND, H.; TAHA, T. E.; AHMADPANAH, M.
- Book ID
- 120271573
- Publisher
- Taylor and Francis Group
- Year
- 1986
- Tongue
- English
- Weight
- 142 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0020-7217
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Surface acoustic waves (SAW) are an ideal tool for the noninvasive detection of conductivity and carrier distributions in otherwise unstructured semiconductor systems. Here we demonstrate a technique that allows for spatially resolved experiments with a resolution of a few acoustic wavelengths. Extr
The effect of surface roughness on adhesion and tribological properties of films and interfaces is of key importance. Therefore, it is of utmost importance to be able to measure this quantity and to predict the effects that different roughness levels may cause. Roughness affects the propagation of s