✦ LIBER ✦
Determination of SiO2 trapped charge distribution by capacitance‐voltage analysis of undoped polycrystalline silicon‐oxide‐silicon capacitors
✍ Scribed by Nissan‐Cohen, Y.; Shappir, J.; Frohman‐Bentchkowsky, D.
- Book ID
- 111651507
- Publisher
- American Institute of Physics
- Year
- 1984
- Tongue
- English
- Weight
- 475 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0003-6951
- DOI
- 10.1063/1.94795
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