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Determination of residual stresses in Pb(Zr[sub 0.53]Ti[sub 0.47])O[sub 3] thin films with Raman spectroscopy

✍ Scribed by Xu, Wei-Hua; Lu, Dexin; Zhang, Tong-Yi


Book ID
126053305
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
314 KB
Volume
79
Category
Article
ISSN
0003-6951

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