✦ LIBER ✦
Determination of reliability from ramped voltage breakdown experiments: application to dual dielectric MIM capacitors : M. Shatzkes, M. Av-Ron and K. V. Srikrishan. Proc. IEEE Reliab. Phys. Conf. 138 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 131 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.