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Determination of Real and Imaginary Structure Potentials of Si from Electron Diffraction Intensities

✍ Scribed by M. Kreutle; G. Meyer-Ehmsen

Book ID: 104538965
Publisher: John Wiley and Sons
Year: 1969
Tongue: English
Weight: 131 KB
Volume: 35
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19690350162

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