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Determination of optical constants and average thickness of thin films on thick substrates using angular distribution of intensity of reflected radiation

✍ Scribed by J. Jaglarz; M. Nowak

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ Rusli, ;Amaratunga, G. A. J. 📂 Article 📅 1995 🏛 The Optical Society 🌐 English ⚖ 214 KB

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