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Determination of material parameters from normalized fluctuation conductivity in YBa2Cu3O7-x thin films

✍ Scribed by Ju-Jin Kim; Jaegyu Kim; Joon Shin Hyun; Hu Jong Lee; Kang Ku Ja

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 469 KB
Volume: 75
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(90)90411-4

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