Determination of interface roughness of Gd films deposited on Si surface using improved wavelet transform of X-ray reflectivity data

✍ Scribed by Oleksiy Starykov; Kenji Sakurai

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 220 KB
• Volume: 244
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2004.10.124