Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique

✍ Scribed by C. Main; R. Brüggemann; D.P. Webb; S. Reynolds

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 376 KB
• Volume: 83
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(92)90076-l