✦ LIBER ✦
Determination of energetic distribution of interface states between gate metal and semiconductor in sub-micron devices from current-voltage characteristics
✍ Scribed by Dhar, S.; Balakrishman, V.R.; Kumar, V.; Ghosh, S.
- Book ID
- 114538021
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 119 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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