𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Determination of effective electron yield from swarm and time delay measurements

✍ Scribed by Marković, V. Lj.; Gocić, S. R.; Stamenković, S. N.; Petrović, Z. Lj.; Radmilović, M.

Book ID
126855853
Publisher
EDP Sciences
Year
2001
Tongue
English
Weight
248 KB
Volume
14
Category
Article
ISSN
1286-0042

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of Layer Thicknesses by To
Determination of Layer Thicknesses by Total Electron Yield Measurements—Substrate Method
✍ Horst Ebel; Robert Svagera; Michael Mantler; Maria F. Ebel 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 831 KB

The application of total electron yield (TEY) measurements to the determination of layer thicknesses is described, presenting an introduction to the principles of TEY measurements, the instrumentation and the evaluation of measured signals. The formulation of the theoretical correlation between meas