Determination of bandgap narrowing and parasitic energy barriers in SiGe HBT's integrated in a bipolar technology

✍ Scribed by Le Tron, B.; Hashim, M.D.R.; Ashburn, P.; Mouis, M.; Chantre, A.; Vincent, G.

• Book ID: 114536778
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 240 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.568031