Deterioration of nickel resistors : F. A. J. Fitzgerald and Grant C. Moyer of the Fitzgerald Laboratories, Inc., presented at the thirty-eight meeting of the American Electrochemical Society (Cleveland, September 30th–October 2nd)

• Publisher: Elsevier Science
• Year: 1920
• Tongue: English
• Weight: 152 KB
• Volume: 190
• Category: Article
• ISSN: 0016-0032
• DOI: 10.1016/s0016-0032(20)91527-2