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Detection sensitivities in proton and electron induced X-ray spectroscopy

✍ Scribed by Wilhad Reuter; Allen Lurio

Publisher
Elsevier Science
Year
1978
Weight
25 KB
Volume
149
Category
Article
ISSN
0029-554X

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Chromia/alutuina catalysts with different metal loading were characterized using X-ray photoelectron spectroscopy (XPS), proton induced X-ray emission (PIXE) and thetmogravimetric (TG) techniques to elucidate the surface structure of these catalysts. XPS studies on calcined samples show a sharp incr