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Detection of transient power quality disturbances based EMD combined with Choi-Williams distribution

✍ Scribed by Liu, Wei ;Guo, Xiaoting

Book ID: 115495635
Publisher: IEEE
Year: 2012
Weight: 513 KB
Series: undefined series for scimag
Category: Article
DOI: 10.1109/ical.2012.6308146

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