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Detection of subwavelength slit-width variation with measurements in the far field by use of an embedded-aperture interferometer configuration

โœ Scribed by Chu, Shu-Chun; Chern, Jyh-Long


Book ID
115390147
Publisher
Optical Society of America
Year
2005
Tongue
English
Weight
760 KB
Volume
22
Category
Article
ISSN
1084-7529

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