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Detection of Styrene Impurities in Phenylacetylene by Resonance-Enhanced Multiphoton Ionization Time-of-Flight Mass Spectrometry

✍ Scribed by Tzeng, W. B.; Narayanan, K.; Lin, J. L.


Book ID
115364399
Publisher
Society for Applied Spectroscopy
Year
1999
Tongue
English
Weight
149 KB
Volume
53
Category
Article
ISSN
0003-7028

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