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Detection of residual impurities after the alkali metal enhanced oxidation of Si(100) surfaces by SIMS and Hall effect measurements

✍ Scribed by G. Pirug; O. Müller; H.P. Bonzel


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
373 KB
Volume
70-71
Category
Article
ISSN
0169-4332

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