✦ LIBER ✦
Detection of low-mass impurities in thin films using MeV heavy-ion elastic scattering and coincidence detection techniques: J A Moore et al, J Appl Phys, 46 (1), 1975, 52–61
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 176 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0042-207X
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