✦ LIBER ✦
Detection of low-level copper contamination in p-type silicon by means of microwave photoconductive decay measurements
✍ Scribed by Yli-Koski, M; Palokangas, M; Haarahiltunen, A; V in l , H; Storg rds, J; Holmberg, H; Sinkkonen, J
- Book ID
- 120185035
- Publisher
- Institute of Physics
- Year
- 2002
- Tongue
- English
- Weight
- 145 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0953-8984
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