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Detection of impurity segregation in zone-confined, polycrystalline tin-doped indium oxide thin films by STM and AFM

✍ Scribed by I.A. Rauf; F. Czerwinski; J.D. Boyd; J.A. Szpunar


Book ID
103992474
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
421 KB
Volume
26
Category
Article
ISSN
0968-4328

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