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Detection of Defects in Wiring Networks Using Time Domain Reflectometry

✍ Scribed by Smail, M.K.; Pichon, L.; Olivas, M.; Auzanneau, F.; Lambert, M.

Book ID: 114653961
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 582 KB
Volume: 46
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2010.2043720

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