✦ LIBER ✦
Detection and localization of gate oxide shorts in MOS transistors by optical-beam-induced current
✍ Scribed by Zanoni, E.; Spiazzi, G.; Dalla Libera, G.; Bonati, B.; Muschitiello, M.; Canali, C.
- Book ID
- 114537337
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 355 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.69925
No coin nor oath required. For personal study only.