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Detection and identification of microparticles occuring in a high-voltage vacuum-insulted gap using electron optical methods.: M M Menon and K D Srivastava, J Appl Phys, 45 (5), 1974, 2094–2098.


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
186 KB
Volume
25
Category
Article
ISSN
0042-207X

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