Detection and characterization of transient surface periodic structures formed during pulsed-laser annealing of semiconductor surfaces by ellipsometry

✍ Scribed by D.J. Brink; J.E. Smit

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 403 KB
• Volume: 233
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(93)90087-6