✦ LIBER ✦
Detecting variations of small-signal equivalent-circuit model parameters in the Si/SiGe HBT process with ANN
✍ Scribed by H. Taher; D. Schreurs; R. Gillon; E. Vestiel; C. van Niekerk; A. Alabadelah; B. Nauwelaers
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 137 KB
- Volume
- 15
- Category
- Article
- ISSN
- 1096-4290
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