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Detecting stacking faults during epitaxial growth by low energy electron diffraction

✍ Scribed by H. Ascolani; J.R. Cerda; P.L. de Andres; J.J. de Miguel; R. Miranda; K. Heinz

Book ID: 116067600
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 851 KB
Volume: 345
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(95)00881-0

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