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Detecting Each Position of Residual Reflections Using a Radiation Pattern Measurement Method for Eliminating Reflections by Distance Changing Technique

✍ Scribed by Kazushi Nishizawa; Yoshihiko Konishi; Shigeru Makino; Takashi Katagi


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
327 KB
Volume
85
Category
Article
ISSN
8756-6621

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