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Detectability of several ideal spatial patterns

โœ Scribed by Henning, G. Bruce; Derrington, Andrew M.; Madden, Brian C.


Book ID
115385640
Publisher
Optical Society of America
Year
1983
Weight
484 KB
Volume
73
Category
Article
ISSN
0030-3941

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On A Statistical Test to Detect Spatial
โœ Ping Sun; G. Hughes ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 293 KB

In the analysis of spatial patterns, the most extensively used index of dispersion is s2/m in which s2 and m arc respectively the sample variance and sample mean of the count x in each sample unit. For statistical testing, the statistic I' = (n -1) s'/m has been introduced since it has an approximat