✦ LIBER ✦
Detailed Characterization of Contact Resistance, Gate-Bias-Dependent Field-Effect Mobility, and Short-Channel Effects with Microscale Elastomeric Single-Crystal Field-Effect Transistors
✍ Scribed by Colin Reese; Zhenan Bao
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 28 KB
- Volume
- 19
- Category
- Article
- ISSN
- 1616-301X
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