Design of testable sequential circuits by repositioning flip-flops

✍ Scribed by Sujit Dey; Srimat T. Chakradhar

• Publisher: Springer US
• Year: 1995
• Tongue: English
• Weight: 862 KB
• Volume: 7
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00993318