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Design of mixed-signal systems-on-a-chip

✍ Scribed by Kundert, K.; Chang, H.; Jefferies, D.; Lamant, G.; Malavasi, E.; Sendig, F.


Book ID
111901238
Publisher
IEEE
Year
2000
Tongue
English
Weight
151 KB
Volume
19
Category
Article
ISSN
0278-0070

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Significant differences in fault models and test methodologies used for analog and digital circuits make a common test for a mixed-signal device difficult. A divide and conquer strategy partitions the circuit into three types of blocks: analog, digital logic and memory. The test and design for testa