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Design of integrated BiCMOS operational amplifiers with low-probability EMI-induced-failures

✍ Scribed by P. Mattei; S. Graffi; Zs.M. Kovács-V; G. Masetti


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
954 KB
Volume
35
Category
Article
ISSN
0026-2714

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